While electron-induced X-ray spectroscopy provides high spatial resolution and excellent light element detection, photon excitation with XTrace is superior in sensitivity and allows trace element ...
A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
The Electron Microscopy shared resource offers techniques that allow researchers to resolve structures from cellular ultrastructure all the way down to molecular interactions. Our expertise in EM ...
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