BANGALORE, India — With efficient test access architecture of much interest to the SoC design and test community, two researchers at an Indian technical institute have proposed a design-for-test ...
Researchers from Mentor Graphics Corp. are proposing a more complete way to test multiple cores on a system-on-chip. At the International Test Conference, Mentor presented a paper that defines SoC ...
Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
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