The majority of semiconductor devices are made up of heterostructures, which are stacked layers of distinctive materials deposited by utilizing distinctive methods. These layers have a thickness in ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...
Nanoparticles find their use in numerous everyday commercial products, including cosmetics, foods and pharmaceuticals. Their characterization at the nanometer scale requires very particular ...
In this interview, industry expert Chris Schwalb provides an overview of the FusionScope®. He explains how this new instrument is transforming correlative microscopy with its innovative AFM-SEM ...
In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...
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Negative-stiffness vibration isolators can easily support the heavy weight of a combined AFM/micro-Raman system, and isolate it The need for precise vibration isolation with scanning probe microscopy ...
Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical ...
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