Electronic Design

Design for Test: ATPG keeps pace with design complexity

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Hackaday

Pocket-sized Test Pattern Generator Helps Check Those CRTs

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...
DATAQUEST

Synopsys advances power and performance for AI and multi-die designs on Samsung Foundry processes at SAFE Forum 2026

Customers are observing significant test efficiency improvements of up to 20% by leveraging AI-powered, silicon-based design ...
Semiconductor Engineering

Are You Using Structural Patterns In An SLT Environment?

Extending the in‑field life of your silicon is essential for long‑term success and for staying ahead of your competitors in today’s rapidly evolving digital world of data centers, automotive and ...
Semiconductor Engineering

Multi-die Testing In The Field Must Build On Established Test Methodologies

The AI revolution is significantly outpacing the IC industry’s ability to sufficiently test multi-chip systems for all necessary failure mechanisms at probe, final test, and system-level test. The ...